Symmetry increases EBSD speed tremendously

09 June 2017

Oxford Instruments has launched Symmetry the world’s first CMOS-based electron backscatter diffraction (EBSD) detector. Symmetry represents a significant breakthrough compared to conventional CCD-based detectors. It has a top acquisition speed in excess of 3000 indexed patterns per second (pps), which is uniquely balanced by uncompromising sensitivity and data quality, providing up to an order of magnitude performance improvement on all samples.

This step change in performance is enabled by optimised CMOS technology and revolutionary optics. The resulting combination of extreme sensitivity, fast frame rates and high pattern resolution means that there is no compromise in data quality across all analytical applications. Even on challenging materials which previously required sensitive and relatively slow CCD cameras (below 100pps), Symmetry routinely achieves speeds in excess of 1000 pps.

Symmetry will be demonstrated at JSM in Sapporo, Japan, during MMC in Manchester, UK, and later in the year at M&M in St. Louis, USA.
The Symmetry detector is ideal for the routine characterization of metal samples at speeds up to 3000 pps.